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year 28, Issue 2 (ICOP & ICPET 2022 2022)
ICOP & ICPET _ INPC _ ICOFS 2022, 28(2): 434-437 |
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Kavosh Tehrani M, Abdalhade A, kiani A. Measurement of refractive index and thickness of MgF2 thin film on BK7 substrate by null ellipsometry. ICOP & ICPET _ INPC _ ICOFS 2022; 28 (2) :434-437
URL: http://opsi.ir/article-1-2755-en.html
URL: http://opsi.ir/article-1-2755-en.html
Abstract: (659 Views)
In this paper, the refractive index and thickness of MgF2 thin film on BK7 substrate have been measured using the null ellipsometry. In this arrangement, helium neon laser light irradiation at angles of 45, 50 and 55 degrees to the sample. The refractive index and thickness of the MgF2 layer is determined by the program written in MATLAB software. The results show a good agreement with the real results.
Type of Study: Experimental |
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