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ICOP & ICPET 2015, 21 - : 537-540 Back to browse issues page
Effect of Thickness on Optical properties of Permalloy
Narges Ansari Dr * 1, Iman Khademi Mr2, Mohammad Mehdi Tehranchi Prof.2
1- Alzahra University
2- Shahid Beheshti University
Abstract:   (2008 Views)
Spectral ellipsometry is presented as an optical technique for measurement of refractive index and extinction coefficient. Spectral ellipsometry between 200 nm and 900 nm of optical wavelength is measured for and of permalloy layers, . Based on classical dispersion the obtained data are analyzed and is fitted for the measured wavelengths and so the effect of thickness on extinction coefficient is explored.
Keywords: classical dispersion model, ellipsometry, permalloy, thickness.
Full-Text [PDF 555 kb]   (858 Downloads)    
Type of Study: Research | Subject: Special
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Ansari N, Khademi I, Tehranchi M M. Effect of Thickness on Optical properties of Permalloy . ICOP & ICPET. 2015; 21 :537-540
URL: http://opsi.ir/article-1-673-en.html


Volume 21 - Back to browse issues page
انجمن اپتیک و فوتونیک ایران Optics and Photonics Society of Iran
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