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ICOP & ICPET 2018, 24 - : 173-176 Back to browse issues page
Resolution enhancement of confocal laser scanning microscopy by detection pinhole axial modulation technique
Mohammad Deljoor * 1, Mahdi Mozdoor dashtabi 1, Reza Massudi 1
1- Shahid Beheshti University, G.C., Laser and Plasma Research Institute
Abstract:   (198 Views)
With the invention of confocal microscopy, in addition to the enhancement of resolution, 3D imaging of thick highly-scattering samples became possible. In this article, an instant data acquisition processing method is introduced using axial modulation of detection pinhole in order to increase the axial resolution of a laser scanning confocal microscope (SCM). This method, improves optical sectioning as well and also resolves the ambiguity of sample positioning (above or below the scanning plane) existing in conventional confocal microscopes.
 
Keywords: Confocal microscopy, Laser scanning microscopy, Detection pinhole axial modulation
Full-Text [PDF 783 kb]   (71 Downloads)    
Type of Study: Research | Subject: Special
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Deljoor M, Mozdoor dashtabi M, Massudi R. Resolution enhancement of confocal laser scanning microscopy by detection pinhole axial modulation technique. ICOP & ICPET. 2018; 24 :173-176
URL: http://opsi.ir/article-1-1538-en.html


Volume 24 - Back to browse issues page
انجمن اپتیک و فوتونیک ایران Optics and Photonics Society of Iran
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