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ICOP & ICPET 2015, 21 - : 869-872 Back to browse issues page
Determination of the optical constants for Cerium-doped Vanadium pentoxide thin film from reflectance spectra
Najme Kasra 1, Farhad Esmaeeli * 1, Sara Falahatgar 1, Babak Etemadi 1
1- guilan university
Abstract:   (1811 Views)
in the present work, the calculation of thickness and optical constants of cerium doped vanadium pentoxide thin films prepared by sol-gel method on glass substrates are presented using single reflection spectra. In order to obtain a suitable fitting for reflection spectra, the classical Drude-Lorentz model has been used for the parametrized dielectric functions. The best fitting parameters for simulating of reflection spectra have been determined by Levenberg-Marquardt optimization method. The simulated reflectance from the retrieved optical constants and thickness are in good agreement with experimental data.
Keywords: Thin film V2O5, Reflectance, optimization, dielectric function
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Type of Study: Research | Subject: Special
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kasra N, esmaeeli F, Falahatgar S, etemadi B. Determination of the optical constants for Cerium-doped Vanadium pentoxide thin film from reflectance spectra. ICOP & ICPET. 2015; 21 :869-872
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Volume 21 - Back to browse issues page
انجمن اپتیک و فوتونیک ایران Optics and Photonics Society of Iran
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