[Home ] [Archive]   [ فارسی ]  
:: Volume 21 - ::
ICOP & ICPET 2015, 21 - : 869-872 Back to browse issues page
Determination of the optical constants for Cerium-doped Vanadium pentoxide thin film from reflectance spectra
Najme Kasra1, Farhad Esmaeeli *1, Sara Falahatgar1, Babak Etemadi1
1- guilan university
Abstract:   (1977 Views)
in the present work, the calculation of thickness and optical constants of cerium doped vanadium pentoxide thin films prepared by sol-gel method on glass substrates are presented using single reflection spectra. In order to obtain a suitable fitting for reflection spectra, the classical Drude-Lorentz model has been used for the parametrized dielectric functions. The best fitting parameters for simulating of reflection spectra have been determined by Levenberg-Marquardt optimization method. The simulated reflectance from the retrieved optical constants and thickness are in good agreement with experimental data.
Keywords: Thin film V2O5, Reflectance, optimization, dielectric function
Full-Text [PDF 752 kb]   (817 Downloads)    
Type of Study: Research | Subject: Special
Send email to the article author

Add your comments about this article
Your username or Email:

CAPTCHA


XML   Persian Abstract   Print


Download citation:
BibTeX | RIS | EndNote | Medlars | ProCite | Reference Manager | RefWorks
Send citation to:

kasra N, esmaeeli F, Falahatgar S, etemadi B. Determination of the optical constants for Cerium-doped Vanadium pentoxide thin film from reflectance spectra. ICOP & ICPET. 2015; 21 :869-872
URL: http://opsi.ir/article-1-736-en.html


Volume 21 - Back to browse issues page
انجمن اپتیک و فوتونیک ایران Optics and Photonics Society of Iran
Persian site map - English site map - Created in 0.05 seconds with 31 queries by YEKTAWEB 3925