[Home ] [Archive]   [ فارسی ]  
:: Volume 21 - ::
ICOP & ICPET 2015, 21 - : 1473-1476 Back to browse issues page
Measuring refractive index and thickness of transparent thin films using Fresnel diffraction from phase step
Morteza Jafari Siavashani * 1, Mohammad Taghi Tavassoly 2, Ehsan Ahadi Akhlaghi 1, S. Roohollah Hosseini 2
1- Institute for Advanced Studies in Basic Sciences
2- University of Tehran
Abstract:   (1764 Views)
Measuring optical parameters of thin films with high accuracy is a challenge in modern science and industry. We introduce a new method to obtain refractive index and thickness of transparent dielectric layer. This method is based on Fresnel diffraction from the phase step in transmission. By recording and analyzing the diffraction pattern versus incident angle, the diagram of visibility versus incident angle is obtained. Therefore by fitting simulated data to experimental ones (visibility versus incident angle), refractive index and height of phase step is determined. The uncertainties of determination of refractive index and thickness are about 0.5% and 0.1%, respectively.
Keywords: Fresnel Diffraction, Phase step, Thickness, Thin films, Refractive index.
Full-Text [PDF 511 kb]   (554 Downloads)    
Type of Study: Research | Subject: Special
Send email to the article author

Add your comments about this article
Your username or Email:

CAPTCHA code


XML   Persian Abstract   Print


Download citation:
BibTeX | RIS | EndNote | Medlars | ProCite | Reference Manager | RefWorks
Send citation to:

Jafari Siavashani M, Tavassoly M T, Ahadi Akhlaghi E, Hosseini S R. Measuring refractive index and thickness of transparent thin films using Fresnel diffraction from phase step. ICOP & ICPET. 2015; 21 :1473-1476
URL: http://opsi.ir/article-1-647-en.html


Volume 21 - Back to browse issues page
انجمن اپتیک و فوتونیک ایران Optics and Photonics Society of Iran
Persian site map - English site map - Created in 0.13 seconds with 30 queries by YEKTAWEB 3781