XML Persian Abstract Print

Download citation:
BibTeX | RIS | EndNote | Medlars | ProCite | Reference Manager | RefWorks
Send citation to:

Ganjkhani Y, Tavassoli M T, Hosseini S R, Jafari Siavashani M, Koohian A. Thickness measurement using the extrema of the intensity profile in Fresnel diffraction from a phase step. ICOP & ICPET _ INPC _ ICOFS. 2015; 21 :777-780
URL: http://opsi.ir/article-1-711-en.html
1- Tehran university
2- IASBS ,Zanjan
Abstract:   (3830 Views)
In Fresnel diffraction from a phase step, the intensity profile and spacing between its extremum points have a universal dependence on step height and light's incident angle. Therefore, plotting variations of the distances of these extrema versus the phase, provides the phase due to the step and the height of the step with remarkable accuracy. We've applied these plots on experimentally obtained data of diffraction patterns from steps with different heights to measure their thickness, using two wavelengths, 532nm and 632.8nm.The uncertainty of the results is less than few nanometers.
Full-Text [PDF 752 kb]   (1377 Downloads)    
Type of Study: Research | Subject: Special

Send email to the article author

Rights and permissions
Creative Commons License This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.

© 2022 All Rights Reserved | Optics and Photonics Society of Iran

Designed & Developed by : Yektaweb