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Jafari Siavashani M, Tavassoly M T, Ahadi Akhlaghi E, Hosseini S R. Measuring refractive index and thickness of transparent thin films using Fresnel diffraction from phase step. ICOP & ICPET _ INPC _ ICOFS 2015; 21 :1473-1476
URL: http://opsi.ir/article-1-647-en.html
URL: http://opsi.ir/article-1-647-en.html
Morteza Jafari Siavashani * 
1, Mohammad Taghi Tavassoly2 , Ehsan Ahadi Akhlaghi1 , S. Roohollah Hosseini2
1, Mohammad Taghi Tavassoly2 , Ehsan Ahadi Akhlaghi1 , S. Roohollah Hosseini2
1- Institute for Advanced Studies in Basic Sciences
2- University of Tehran
2- University of Tehran
Abstract: (3822 Views)
Measuring optical parameters of thin films with high accuracy is a challenge in modern science and industry. We introduce a new method to obtain refractive index and thickness of transparent dielectric layer. This method is based on Fresnel diffraction from the phase step in transmission. By recording and analyzing the diffraction pattern versus incident angle, the diagram of visibility versus incident angle is obtained. Therefore by fitting simulated data to experimental ones (visibility versus incident angle), refractive index and height of phase step is determined. The uncertainties of determination of refractive index and thickness are about 0.5% and 0.1%, respectively.
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