<?xml version="1.0" encoding="utf-8"?>
<journal>
<title>Accepted and Presented Articles of OPSI Conferences</title>
<title_fa>مقالات پذیرفته و ارائه شده در کنفرانس‌های انجمن اپتیک و فوتونیک ایران</title_fa>
<short_title>ICOP &amp; ICPET _ INPC _ ICOFS</short_title>
<subject>Basic Sciences</subject>
<web_url>http://opsi.ir</web_url>
<journal_hbi_system_id>1</journal_hbi_system_id>
<journal_hbi_system_user>admin</journal_hbi_system_user>
<journal_id_issn>1126-3278</journal_id_issn>
<journal_id_issn_online>10</journal_id_issn_online>
<journal_id_pii>8</journal_id_pii>
<journal_id_doi>7</journal_id_doi>
<journal_id_iranmedex></journal_id_iranmedex>
<journal_id_magiran></journal_id_magiran>
<journal_id_sid>14</journal_id_sid>
<journal_id_nlai>8888</journal_id_nlai>
<journal_id_science>13</journal_id_science>
<language>fa</language>
<pubdate>
	<type>jalali</type>
	<year>1392</year>
	<month>10</month>
	<day>1</day>
</pubdate>
<pubdate>
	<type>gregorian</type>
	<year>2014</year>
	<month>1</month>
	<day>1</day>
</pubdate>
<volume>20</volume>
<number>مجموعه مقالات پذیرفته و ارائه شده در بیستمین کنفرانس اپتیک و فوتونیک ایران</number>
<publish_type>online</publish_type>
<publish_edition>1</publish_edition>
<article_type>fulltext</article_type>
<articleset>
	<article>


	<language>en</language>
	<article_id_doi></article_id_doi>
	<title_fa>Experimental and Computer Calculated Sputtering Yield of Sputtered Au by Ne Ions at Different Energies and Various Incidence Angles</title_fa>
	<title>Experimental and Computer Calculated Sputtering Yield of Sputtered Au by Ne Ions at Different Energies and Various Incidence Angles</title>
	<subject_fa>تخصصی</subject_fa>
	<subject>Special</subject>
	<content_type_fa>پژوهشي</content_type_fa>
	<content_type>Research</content_type>
	<abstract_fa>Nowadays a plenty of applications of thin film in different subjects such as scientific and industrial items has been grown. Au deposition is very important in microelectronic device fabrication. In this research project we studied Au sputtering in different energies and different angles of incident ions. Results show that the measured sputtering yield confirms the results that reached by TRIM.SP software. In specific range, sputtering yield increases by increasing energy and incident angle of bombardment ion particles.</abstract_fa>
	<abstract>Nowadays a plenty of applications of thin film in different subjects such as scientific and industrial items has been grown. Au deposition is very important in microelectronic device fabrication. In this research project we studied Au sputtering in different energies and different angles of incident ions. Results show that the measured sputtering yield confirms the results that reached by TRIM.SP software. In specific range, sputtering yield increases by increasing energy and incident angle of bombardment ion particles.</abstract>
	<keyword_fa>Au sputtering, sputtering yield, molecular dynamics model, incident ion energy, angle of sputtering collision ions</keyword_fa>
	<keyword>Au sputtering, sputtering yield, molecular dynamics model, incident ion energy, angle of sputtering collision ions</keyword>
	<start_page>1005</start_page>
	<end_page>1008</end_page>
	<web_url>http://opsi.ir/browse.php?a_code=A-10-1-382&amp;slc_lang=en&amp;sid=1</web_url>


<author_list>
	<author>
	<first_name>Ehsan</first_name>
	<middle_name></middle_name>
	<last_name>Dorani</last_name>
	<suffix></suffix>
	<first_name_fa>Ehsan</first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa>Dorani</last_name_fa>
	<suffix_fa></suffix_fa>
	<email>ehsandorrani@yahoo.com</email>
	<code>10031947532846001486</code>
	<orcid>10031947532846001486</orcid>
	<coreauthor>Yes
</coreauthor>
	<affiliation>Islamic Azad University, Kahnouj Branch</affiliation>
	<affiliation_fa>Islamic Azad University, Kahnouj Branch</affiliation_fa>
	 </author>


	<author>
	<first_name>S. Peyman </first_name>
	<middle_name></middle_name>
	<last_name>Abbasi</last_name>
	<suffix></suffix>
	<first_name_fa>S. Peyman </first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa>Abbasi</last_name_fa>
	<suffix_fa></suffix_fa>
	<email>Pabbasi2001@gmail.com</email>
	<code>10031947532846001487</code>
	<orcid>10031947532846001487</orcid>
	<coreauthor>No</coreauthor>
	<affiliation>Iranian National Center for Laser Science and Technology</affiliation>
	<affiliation_fa>Iranian National Center for Laser Science and Technology</affiliation_fa>
	 </author>


	<author>
	<first_name>Abolhassan</first_name>
	<middle_name></middle_name>
	<last_name>Alimoradi</last_name>
	<suffix></suffix>
	<first_name_fa>Abolhassan</first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa>Alimoradi</last_name_fa>
	<suffix_fa></suffix_fa>
	<email>Abolalimo@gmail.com</email>
	<code>10031947532846001488</code>
	<orcid>10031947532846001488</orcid>
	<coreauthor>No</coreauthor>
	<affiliation>Iranian National Center for Laser Science and Technology</affiliation>
	<affiliation_fa>Iranian National Center for Laser Science and Technology</affiliation_fa>
	 </author>


</author_list>


	</article>
</articleset>
</journal>
