AU - kasra, najme AU - esmaeeli, Farhad AU - Falahatgar, sara AU - etemadi, babak TI - Determination of the optical constants for Cerium-doped Vanadium pentoxide thin film from reflectance spectra PT - JOURNAL ARTICLE TA - opsi JN - opsi VO - 21 VI - 0 IP - 0 4099 - http://opsi.ir/article-1-736-en.html 4100 - http://opsi.ir/article-1-736-en.pdf SO - opsi 0 ABĀ  - in the present work, the calculation of thickness and optical constants of cerium doped vanadium pentoxide thin films prepared by sol-gel method on glass substrates are presented using single reflection spectra. In order to obtain a suitable fitting for reflection spectra, the classical Drude-Lorentz model has been used for the parametrized dielectric functions. The best fitting parameters for simulating of reflection spectra have been determined by Levenberg-Marquardt optimization method. The simulated reflectance from the retrieved optical constants and thickness are in good agreement with experimental data. CP - IRAN IN - LG - eng PB - opsi PG - 869 PT - Research YR - 2015