TY - JOUR JF - opsi JO - ICOP & ICPET _ INPC _ ICOFS VL - 24 IS - 0 PY - 2018 Y1 - 2018/3/01 TI - Resolution enhancement of confocal laser scanning microscopy by detection pinhole axial modulation technique TT - بهبود توان تفکیک میکروسکوپی جاروب لیزری هم‌کانون با روش مدولاسیون محوری روزنه‌ی آشکارسازی N2 - With the invention of confocal microscopy, in addition to the enhancement of resolution, 3D imaging of thick highly-scattering samples became possible. In this article, an instant data acquisition processing method is introduced using axial modulation of detection pinhole in order to increase the axial resolution of a laser scanning confocal microscope (SCM). This method, improves optical sectioning as well and also resolves the ambiguity of sample positioning (above or below the scanning plane) existing in conventional confocal microscopes. SP - 173 EP - 176 AU - Deljoor, Mohammad AU - Mozdoor dashtabi, Mahdi AU - Massudi, Reza AD - Shahid Beheshti University, G.C., Laser and Plasma Research Institute KW - Confocal microscopy KW - Laser scanning microscopy KW - Detection pinhole axial modulation UR - http://opsi.ir/article-1-1538-en.html ER -