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1- guilan university
Abstract:   (3312 Views)
in the present work, the calculation of thickness and optical constants of cerium doped vanadium pentoxide thin films prepared by sol-gel method on glass substrates are presented using single reflection spectra. In order to obtain a suitable fitting for reflection spectra, the classical Drude-Lorentz model has been used for the parametrized dielectric functions. The best fitting parameters for simulating of reflection spectra have been determined by Levenberg-Marquardt optimization method. The simulated reflectance from the retrieved optical constants and thickness are in good agreement with experimental data.
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Type of Study: Research | Subject: Special

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