1- guilan university
Abstract: (3312 Views)
in the present work, the calculation of thickness and optical constants of cerium doped vanadium pentoxide thin films prepared by sol-gel method on glass substrates are presented using single reflection spectra. In order to obtain a suitable fitting for reflection spectra, the classical Drude-Lorentz model has been used for the parametrized dielectric functions. The best fitting parameters for simulating of reflection spectra have been determined by Levenberg-Marquardt optimization method. The simulated reflectance from the retrieved optical constants and thickness are in good agreement with experimental data.
Type of Study:
Research |
Subject:
Special