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Abstract:   (5248 Views)
In the present experimental work, Copper Oxide thin films were deposited by reactive radio frequency magnetron sputtering on glass substrates at various power and under the same conditions. Effect of changing the power on structural and electrical properties of the layers were studied. The structural properties, and optical properties of the copper Oxide films are investigated by X-ray Diffraction (XRD), and UV-IR Spectroscopy techniques respectively. It was observed with increasing power, Copper Oxide phase changes from CuO to Cu2O. Optical properties also are obtained.
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Type of Study: Research | Subject: Special

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