1- Shahrood University of Technology
Abstract: (5578 Views)
Abstract- CuO/ZnO:Al hetero-junction were fabricated on FTO substrate by spray pyrolysis method. The prepared sample was characterized by XRD and UV-Vis. spectra, also I-V characterization in dark and under standard illumination. We found the investigated layers have a polycrystalline structure with an optical band gap of 3.25 eV for ZnO layer and 1.63 eV for CuO layer. Electrical characterization of the sample showed a rectifying behavior. The device reaction to the illumination showed that it has a higher sensitivity in reverse bias condition compared with that in forward bias.
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